Size-Tuned Plastic Flow Localization in Irradiated Materials at the Submicron Scale

Cui, Yinan; Po, Giacomo; Ghoniem, Nasr

doi:10.1103/physrevlett.120.215501

Size-Tuned Plastic Flow Localization in Irradiated Materials at the Submicron Scale

Journal Article · Tue May 22 00:00:00 EDT 2018 · Physical Review Letters

DOI:https://doi.org/10.1103/physrevlett.120.215501· OSTI ID:1541320

Cui, Yinan ^[1]; Po, Giacomo ^[2]; Ghoniem, Nasr ^[2]

Univ. of California, Los Angeles, CA (United States). Mechanical and Aerospace Engineering Dept.; DOE/OSTI
Univ. of California, Los Angeles, CA (United States). Mechanical and Aerospace Engineering Dept.

Three-dimensional discrete dislocation dynamics (3D-DDD) simulations reveal that, with reduction of sample size in the submicron regime, the mechanism of plastic flow localization in irradiated materials transitions from irradiation-controlled to an intrinsic dislocation source controlled. Furthermore, the spatial correlation of plastic deformation decreases due to weaker dislocation interactions and less frequent cross slip as the system size decreases, thus manifesting itself in thinner dislocation channels. A simple model of discrete dislocation source activation coupled with cross slip channel widening is developed to reproduce and physically explain this transition. In order to quantify the phenomenon of plastic flow localization, we introduce a “deformation localization index,” with implications to the design of radiation-resistant materials.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of California, Los Angeles, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Fusion Energy Sciences (FES)

Grant/Contract Number:: SC0018410

OSTI ID:: 1541320

Alternate ID(s):: OSTI ID: 1438291

Journal Information:: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 21 Vol. 120; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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