skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: III-nitride transistor with trench gate

Patent ·
OSTI ID:1532041

A transistor includes a stack of III-nitride semiconductor layers, the stack having a frontside and a backside, a source electrode in contact with the frontside of the stack, a drain electrode in contact with the backside of the stack, a trench extending through a portion of the stack, the trench having a sidewall, and a gate structure formed in the trench, including an AlN layer formed on the sidewall of the trench, an insulating cap layer formed on the AlN layer, and a gate electrode formed on the insulator cap layer and covering the sidewall of the trench.

Research Organization:
HRL Laboratories, LLC, Malibu, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AR000450
Assignee:
HRL Laboratories, LLC (Malibu, CA)
Patent Number(s):
9,865,725
Application Number:
15/099,390
OSTI ID:
1532041
Resource Relation:
Patent File Date: 2016-04-14
Country of Publication:
United States
Language:
English

References (10)

Semiconductor device and manufacturing method thereof patent-application October 2006
Method for Manufacturing Nitride Semiconductor Element patent-application November 2013
III-Nitride Insulating-Gate Transistors with Passivation patent-application December 2015
Semiconductor Device and Method for Manufacturing Same patent-application November 2013
Semiconductor Device and Method for Producing Same patent-application April 2014
Semiconductor Device and Method for Producing Same patent-application July 2013
Semiconductor Device and Method for Producing Same patent-application August 2013
Novel Vertical Heterojunction Field-Effect Transistors with Re-grown AlGaN/GaN Two-Dimensional Electron Gas Channels on GaN Substrates journal April 2010
Semiconductor device and fabrication method of the same patent-application October 2006
Semiconductor Device patent-application May 2009