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Initial observations of the femtosecond timing jitter at the European XFEL

Journal Article · · Optics Letters
DOI:https://doi.org/10.1364/ol.44.001650· OSTI ID:1529232
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  1. European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany)
  2. Christian-Albrechts-Univ. zu Kiel, Kiel (Germany). Inst. für Experimentelle und Angewandte Physik
  3. European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany); Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany)
  4. La Trobe Univ., Melbourne, VIC (Australia). La Trobe Inst. for Molecular Science, Dept. of Chemistry and Physics
  5. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
  6. European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
  7. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
  8. European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany; La Trobe Univ., Melbourne, VIC (Australia). La Trobe Inst. for Molecular Science, Dept. of Chemistry and Physics
Intense, ultrashort, and high-repetition-rate X-ray pulses, combined with a femtosecond optical laser, allow pump-probe experiments with fast data acquisition and femtosecond time resolution. However, the relative timing of the X-ray pulses and the optical laser pulses can be controlled only to a level of the intrinsic error of the instrument which, without characterization, limits the time resolution of experiments. This limitation inevitably calls for a precise determination of the relative arrival time, which can be used after measurement for sorting and tagging the experimental data to a much finer resolution than it can be controlled to. The observed root-mean-square timing jitter between the X-ray and the optical laser at the SPB/SFX instrument at European XFEL was 308 fs. This first measurement of timing jitter at the European XFEL provides an important step in realizing ultrafast experiments at this novel X-ray source. Lastly, a method for determining the change in the complex refractive index of samples is also presented.
Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
1529232
Journal Information:
Optics Letters, Journal Name: Optics Letters Journal Issue: 7 Vol. 44; ISSN 0146-9592; ISSN OPLEDP
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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Cited By (6)

Time-resolved serial femtosecond crystallography at the European XFEL journal November 2019
The Single Particles, Clusters and Biomolecules and Serial Femtosecond Crystallography instrument of the European XFEL: initial installation journal April 2019
Femtosecond timing synchronization at megahertz repetition rates for an x-ray free-electron laser journal January 2020
The Single Particles, Clusters and Biomolecules and Serial Femtosecond Crystallography instrument of the European XFEL: initial installation text January 2019
Time-resolved serial femtosecond crystallography at the European XFEL text January 2019
Femtosecond timing synchronization at megahertz repetition rates for an x-ray free-electron laser text January 2020

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