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The influence of the topology of test circuits on the interrupting performance of circuit breakers

Journal Article · · IEEE Transactions on Power Delivery
DOI:https://doi.org/10.1109/61.473374· OSTI ID:152907
;  [1]
  1. Delft Univ. of Technology, Delft (Netherlands). Power Systems Lab.
High-voltage circuit breakers are tented in the High Power Laboratory where transient recovery voltages (TRVs) are generated by networks consisting of lumped elements. In the IEC and ANSI standards the TRV waveforms are described, but not the topology of the test circuits. This paper compares different direct TRV test circuits which generate the same initial part of the TRV waveform. It is demonstrated that the surge impedance of the TRV test circuit is an important parameter. The different in interrupting performance of the TB in the test circuits with the different surge impedances is caused by the influence of the arc-circuit interaction.
OSTI ID:
152907
Report Number(s):
CONF-950103--
Journal Information:
IEEE Transactions on Power Delivery, Journal Name: IEEE Transactions on Power Delivery Journal Issue: 4 Vol. 10; ISSN 0885-8977; ISSN ITPDE5
Country of Publication:
United States
Language:
English

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