Spectroscopic setup for submicrometer-resolution mapping of low-signal absorption and luminescence using photothermal heterodyne imaging and photon-counting techniques

Papernov, S.

doi:10.1364/AO.58.003908

Spectroscopic setup for submicrometer-resolution mapping of low-signal absorption and luminescence using photothermal heterodyne imaging and photon-counting techniques

Journal Article · Thu May 09 00:00:00 EDT 2019 · Applied Optics

DOI:https://doi.org/10.1364/AO.58.003908· OSTI ID:1515832

Papernov, S. ^[1]

Univ. of Rochester, Rochester, NY (United States). Lab for Laser Energetics; Laboratory for Laser Energetics, University of Rochester

A spectroscopic setup that enables one to map the absorption and photoluminescence with submicrometer spatial resolution and high sensitivity is described. Here a photothermal heterodyne imaging pump/probe technique is employed for absorption mapping, and low-signal, spatially resolved photoluminescence is recorded using photon counting. High-spatial-resolution mapping is accomplished by using high-numerical-aperture microscope objective focusing laser beams (pump and probe) into a submicrometer spot and raster-scanning sample mounted on the nanopositioning translation stage. Performance of the setup is illustrated by mapping absorption and luminescence of the hafnium oxide film with embedded hafnium nanoparticles and multilayer dielectric grating. In both cases submicrometer spatial resolution is demonstrated and possible physical mechanisms leading to image contrast on a submicrometer scale is discussed

View Accepted Manuscript (DOE)

Research Organization:: Univ. of Rochester, Rochester, NY (United States). Lab for Laser Energetics

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Contributing Organization:: Laboratory for Laser Energetics, University of Rochester

Grant/Contract Number:: NA0003856

OSTI ID:: 1515832

Report Number(s):: 2018-293, 1499; 2018-293, 2458, 1499

Journal Information:: Applied Optics, Journal Name: Applied Optics Journal Issue: 14 Vol. 58; ISSN 1559-128X; ISSN APOPAI

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

References (14)

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