Approach to Defect-Free Lifetime and High Electron Density in CdTe
- Washington State Univ., Pullman, WA (United States)
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
Achieving simultaneously high carrier density and lifetime is crucial to II-VI semiconductor-based applications such as photovoltaics and infrared detectors; yet, it is a challenging task. In this work, high purity CdTe single crystals doped with indium (In) were grown by vertical Bridgman melt growth under carefully controlled stoichiometry. Two-photon excitation time-resolved photoluminescence was employed to measure bulk recombination lifetime by eliminating surface recombination effects. By adjusting stoichiometry with post growth annealing, high-net free carrier density approaching 1018 cm-3 was attained simultaneously with lifetime approaching the radiative limit by suppressing non-radiative recombination centers.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States); Washington State Univ., Pullman, WA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- Grant/Contract Number:
- AC36-08GO28308; EE0007537; EE0008548
- OSTI ID:
- 1512683
- Alternate ID(s):
- OSTI ID: 1644037; OSTI ID: 1741033
- Report Number(s):
- NREL/JA-5K00-73893
- Journal Information:
- Journal of Electronic Materials, Vol. 48, Issue 7; ISSN 0361-5235
- Publisher:
- SpringerCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Final Report: Preparation and Evaluation of N-Type CdSeTe and CdTe as an Absorber in Thin Film PV
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report | March 2021 |
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