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Title: Approach to Defect-Free Lifetime and High Electron Density in CdTe

Journal Article · · Journal of Electronic Materials
 [1];  [2];  [2];  [2];  [1];  [2];  [1]
  1. Washington State Univ., Pullman, WA (United States)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States)

Achieving simultaneously high carrier density and lifetime is crucial to II-VI semiconductor-based applications such as photovoltaics and infrared detectors; yet, it is a challenging task. In this work, high purity CdTe single crystals doped with indium (In) were grown by vertical Bridgman melt growth under carefully controlled stoichiometry. Two-photon excitation time-resolved photoluminescence was employed to measure bulk recombination lifetime by eliminating surface recombination effects. By adjusting stoichiometry with post growth annealing, high-net free carrier density approaching 1018 cm-3 was attained simultaneously with lifetime approaching the radiative limit by suppressing non-radiative recombination centers.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States); Washington State Univ., Pullman, WA (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
AC36-08GO28308; EE0007537; EE0008548
OSTI ID:
1512683
Alternate ID(s):
OSTI ID: 1644037; OSTI ID: 1741033
Report Number(s):
NREL/JA-5K00-73893
Journal Information:
Journal of Electronic Materials, Vol. 48, Issue 7; ISSN 0361-5235
Publisher:
SpringerCopyright Statement
Country of Publication:
United States
Language:
English

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Cited By (1)