Many applications, such as compact accelerators and electron microscopy, demand high brightness electron beams with small source size and ultralow emittance. Diamond emitters manufactured with semiconductor processes can be employed in such compact beam sources. The micrometer-scale pyramid structure of the emitter allows enhancement of the external field compared to that at the substrate, leading to electron emission with small beam size. We investigate the dependence of the field enhancement on the shape of the emitter and the resulting emission characteristics. The beam formation and dynamics are simulated with the LSP particle-in-cell code to obtain the macroscopic observables. To account for the semiconductor charge transport in the bulk material and the tunneling through the surface, a first-principle semiclassical Monte Carlo emission model is developed and applied to the diamond pyramid. Using this Monte Carlo emission model and the result from the geometric field enhancement calculation, we construct a simple model to qualitatively explain the measured emission characteristics. In conclusion, a comparison between our model and experiments indicates that the beam current is mostly emitted at the apex of the emitter.
Huang, C. -K., et al. "Modeling of diamond field emitter arrays for a compact source of high brightness electron beams." Journal of Applied Physics, vol. 125, no. 16, Apr. 2019. https://doi.org/10.1063/1.5086292
Huang, C. -K., Andrews, Heather Lynn, Baker, Ryan Christopher, Fleming, Ryan Lee, Kim, Donsung, Kwan, Thomas J. T., Piryatinski, Andrei, Pavlenko, Vitaly, & Simakov, Evgenya Ivanovna (2019). Modeling of diamond field emitter arrays for a compact source of high brightness electron beams. Journal of Applied Physics, 125(16). https://doi.org/10.1063/1.5086292
Huang, C. -K., Andrews, Heather Lynn, Baker, Ryan Christopher, et al., "Modeling of diamond field emitter arrays for a compact source of high brightness electron beams," Journal of Applied Physics 125, no. 16 (2019), https://doi.org/10.1063/1.5086292
@article{osti_1511625,
author = {Huang, C. -K. and Andrews, Heather Lynn and Baker, Ryan Christopher and Fleming, Ryan Lee and Kim, Donsung and Kwan, Thomas J. T. and Piryatinski, Andrei and Pavlenko, Vitaly and Simakov, Evgenya Ivanovna},
title = {Modeling of diamond field emitter arrays for a compact source of high brightness electron beams},
annote = {Many applications, such as compact accelerators and electron microscopy, demand high brightness electron beams with small source size and ultralow emittance. Diamond emitters manufactured with semiconductor processes can be employed in such compact beam sources. The micrometer-scale pyramid structure of the emitter allows enhancement of the external field compared to that at the substrate, leading to electron emission with small beam size. We investigate the dependence of the field enhancement on the shape of the emitter and the resulting emission characteristics. The beam formation and dynamics are simulated with the LSP particle-in-cell code to obtain the macroscopic observables. To account for the semiconductor charge transport in the bulk material and the tunneling through the surface, a first-principle semiclassical Monte Carlo emission model is developed and applied to the diamond pyramid. Using this Monte Carlo emission model and the result from the geometric field enhancement calculation, we construct a simple model to qualitatively explain the measured emission characteristics. In conclusion, a comparison between our model and experiments indicates that the beam current is mostly emitted at the apex of the emitter.},
doi = {10.1063/1.5086292},
url = {https://www.osti.gov/biblio/1511625},
journal = {Journal of Applied Physics},
issn = {ISSN 0021-8979},
number = {16},
volume = {125},
place = {United States},
publisher = {American Institute of Physics (AIP)},
year = {2019},
month = {04}}
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 865https://doi.org/10.1016/j.nima.2016.07.052