skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Large-Area Material and Junction Damage in c–Si Solar Cells by Potential-Induced Degradation

Journal Article · · Solar RRL

This paper reports a new potential-induced degradation (PID) mechanism for crystalline silicon (c-Si), where Na diffuses everywhere and causes large-area material and junction degradation with point defects. Multiple characterization techniques are combined - Kelvin probe force microscopy, electron-beam induced current, dark lock-in thermography, transmission electron microscopy, time-of-flight secondary-ion mass spectrometry, and microwave photoconductance decay - as well as density functional theory (DFT) calculations. These characterization techniques and theoretical calculations are complementary in various aspects of a material's chemical, structural, electrical, and optoelectrical nature, as well as in atomic, nanometer, micrometer, millimeter, and cell and module scales. All results point consistently to a new discovery: substantial large-area deterioration of materials and junctions play a major role in c-Si PID (in addition to the previously reported local shunting defect caused by Na diffusion to planar defects). Furthermore, this new finding reveals a key PID component and leads to a new strategy for tailoring c-Si photovoltaics to ultimately resolve the PID issue.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1509669
Report Number(s):
NREL/JA-5K00-72059
Journal Information:
Solar RRL, Vol. 3, Issue 4; ISSN 2367-198X
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

References (22)

Generalized Gradient Approximation Made Simple journal October 1996
Sodium Accumulation at Potential-Induced Degradation Shunted Areas in Polycrystalline Silicon Modules journal November 2016
Potential-induced degradation in solar cells: Electronic structure and diffusion mechanism of sodium in stacking faults of silicon journal September 2014
Potential-induced degradation in photovoltaic modules: a critical review journal January 2017
Development of in-situ high-voltage and high-temperature stressing capability on atomic force microscopy platform journal December 2017
How Surface Potential Determines the Kinetics of the First Hole Transfer of Photocatalytic Water Oxidation journal July 2014
Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells journal January 2014
Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization journal February 2018
Photovoltaic failure and degradation modes: PV failure and degradation modes
  • Jordan, Dirk C.; Silverman, Timothy J.; Wohlgemuth, John H.
  • Progress in Photovoltaics: Research and Applications, Vol. 25, Issue 4 https://doi.org/10.1002/pip.2866
journal January 2017
Prevention of Potential-Induced Degradation With Thin Ionomer Film journal January 2015
Electrically active sodium-related defect centres in silicon journal August 2013
On the mechanism of potential-induced degradation in crystalline silicon solar cells journal July 2012
Influence of crystal defect density of silicon wafers on potential-induced degradation (PID) in solar cells and modules: Influence of crystal defect density of silicon wafers journal May 2017
The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells journal March 2013
Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination journal May 2014
Junction Quality of SnO 2 -Based Perovskite Solar Cells Investigated by Nanometer-Scale Electrical Potential Profiling journal October 2017
Extrinsic ion migration in perovskite solar cells journal January 2017
Microstructural Analysis of Crystal Defects Leading to Potential-Induced Degradation (PID) of Si Solar Cells journal January 2013
From ultrasoft pseudopotentials to the projector augmented-wave method journal January 1999
Investigations on the Formation of Stacking Fault-like PID-shunts journal August 2016
The Formation Time of Ti–O and Ti–O –Ti Radicals at the n-SrTiO 3 /Aqueous Interface during Photocatalytic Water Oxidation journal December 2016
PID Testing Method Suitable for Process Control of Solar Cells Mass Production journal January 2015