Direct imaging of sketched conductive nanostructures at the LaAlO3/SrTiO3 interface

Jiang, Zhanzhi; Wu, Xiaoyu; Lee, Hyungwoo; Lee, Jung-Woo; Li, Jianan; Cheng, Guanglei; Eom, Chang-Beom; Levy, Jeremy; Lai, Keji

doi:10.1063/1.5005917

Direct imaging of sketched conductive nanostructures at the LaAlO₃/SrTiO₃ interface

Journal Article · Wed Dec 06 04:00:00 EST 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5005917· OSTI ID:1505558

^[1]; Wu, Xiaoyu ^[2]; Lee, Hyungwoo ^[3]; Lee, Jung-Woo ^[3]; ^[4]; Cheng, Guanglei ^[5]; Eom, Chang-Beom ^[3]; Levy, Jeremy ^[4]; Lai, Keji ^[2]

Univ. of Texas, Austin, TX (United States); Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA
Univ. of Texas, Austin, TX (United States)
Univ. of Wisconsin, Madison, WI (United States)
Univ. of Pittsburgh, PA (United States); Pittsburgh Quantum Inst., PA (United States)
Univ. of Pittsburgh, PA (United States); Pittsburgh Quantum Inst., PA (United States); Univ. of Science and Technology of China, Hefei (China)

Nanoscale control of the quasi-two-dimensional electron gas at the LaAlO₃/SrTiO₃ (LAO/STO) interface by a conductive probe tip has triggered the development of a number of electronic devices. While the spatial distribution of the conductance is crucial for such devices, it is challenging to directly visualize the local electrical properties at the buried interface. Here, we demonstrate conductivity imaging of sketched nanostructures at the LAO/STO interface by microwave impedance microscopy (MIM) with a lateral resolution on the order of 100 nm. The sheet conductance extracted from the MIM data agrees with the transport measurement. The tip-induced insulator-to-metal transition is observed above a threshold voltage of +4 V. Our work paves the way for studying emergent phenomena at oxide interfaces by probing nanoscale conductance distribution.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of Texas, Austin, TX (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0010308

OSTI ID:: 1505558

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 23 Vol. 111; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited By (2)

High sensitivity variable-temperature infrared nanoscopy of conducting oxide interfaces Luo, Weiwei; Boselli, Margherita; Poumirol, Jean-Marie arXiv https://doi.org/10.48550/arxiv.1905.05062	text	January 2019
High sensitivity variable-temperature infrared nanoscopy of conducting oxide interfaces Luo, Weiwei; Boselli, Margherita; Poumirol, Jean-Marie Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-10672-5	journal	June 2019

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