CONTRIBUTION OF X-RAY TOPOGRAPHY AND HIGH RESOLUTION DIFFRACTION TO THE STUDY OF DEFECTS IN SIC
Journal Article
·
· Journal of Physics. D, Applied Physics
No abstract prepared.
- Research Organization:
- Brookhaven National Laboratory, National Synchrotron Light Source (US)
- Sponsoring Organization:
- DOE/OFFICE OF SCIENCE (US)
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 15015293
- Report Number(s):
- BNL-74081-2005-JA; JPAPBE; TRN: US200514%%439
- Journal Information:
- Journal of Physics. D, Applied Physics, Vol. 36; Other Information: PBD: 1 Jan 2003; ISSN 0022-3727
- Country of Publication:
- United States
- Language:
- English
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