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Title: Temperature Dependence of Disorder Accumulation and Amorphization in Au-Ion Irradiated 6H-SiC

Journal Article · · Physical Review. B, Condensed Matter, 70(16):165208, 1-8
OSTI ID:15010683

Disorder accumulation and amorphization in 6H-SiC single crystals irradiated with 2.0 MeV Au₂⁺ ions at temperatures ranging from 150 to 550 K have been investigated systematically based on 0.94 MeV D⁺ channeling analyses along the <0001> axis. Physical models have been applied to fit the experimental data and to interpret the temperature dependence of the disordering processes. Results show that defect-stimulated amorphization in Au₂⁺-irradiated 6H-SiC dominates the disordering processes at temperatures below 500 K, while formation of clusters becomes predominant above 500 K. Two distinctive dynamic recovery stages are observed over the temperature range from 150 to 550 K, resulting from the coupled processes of close-pair recombination and interstitial migration and annihilation on both sublattices. These two stages overlap very well with the previously observed thermal recovery stages. Based on the model fits, the critical temperature for amorphization in 6H-SiC under the Au₂⁺ ion irradiation conditions corresponds to 501 +- 10 K.

Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
15010683
Report Number(s):
PNNL-SA-41270; 3448; KC0201020; TRN: US0500312
Journal Information:
Physical Review. B, Condensed Matter, 70(16):165208, 1-8, Vol. 70, Issue 16
Country of Publication:
United States
Language:
English