Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy.

Journal Article · Mon May 12 00:00:00 EDT 2003 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1573352· OSTI ID:15003797

Schroer, C G; Kuhlmann, M; Gunzler, T F; Lengeler, B; Richwin, M; Griesebock, B; Lutzenkirchen-Hect, D; Frahm, R; Ziegler, E; Mashayekhi, A; Haeffner, D R; Grunwaldt, J -D; Baiker, A; XFD,

Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near-edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses.

• Research Organization: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US); Aachen Univ.; Bergische Univ. Wuppertal; European Synchrotron Radiation Facility; Swiss Federal Inst. of Tech.
• Sponsoring Organization: USDOE
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 15003797
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 19 Vol. 82; ISSN APPLAB; ISSN 0003-6951
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ABSORPTION SPECTROSCOPY
CHEMICAL STATE
DATA ACQUISITION SYSTEMS
ELEMENTS
HARD X RADIATION
LENSES
MONOCHROMATORS
SPECTRA
VALENCE
X-RAY SPECTROSCOPY
advanced photon source