Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering

Journal Article · Mon Apr 17 04:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2196062· OSTI ID:20779134

Schroer, C G; Kuhlmann, M; Roth, S V; Gehrke, R; Stribeck, N; Almendarez-Camarillo, A; Lengeler, B ^[1]

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1. HASYLAB at DESY, Notkestrasse 85, D-22607 Hamburg (Germany)

Small-angle x-ray scattering is combined with scanning microtomography to reconstruct the small-angle diffraction pattern in the direction of the tomographic rotation axis at each location on a virtual section through a specimen. These data yield information about the local nanoscale structure of the sample. With rotational symmetry present in the diffraction patterns, e.g., for isotropic or fiber-textured scatterers, the full reciprocal space information in the small-angle scattering regime can be reconstructed at each location inside the specimen. The method is illustrated investigating a polymer rod made by injection molding.

• OSTI ID: 20779134
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 16 Vol. 88; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
FIBERS
MAPPING
MOLDING
NANOSTRUCTURES
POLYMERS
ROTATION
SMALL ANGLE SCATTERING
SYMMETRY
TOMOGRAPHY
X-RAY DIFFRACTION