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Title: Measurement of strain in Al-Cu interconnect lines with x-ray microdiffraction.

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.370819· OSTI ID:15002935

No abstract prepared.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Univ. of Wisconsin at Madison (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
15002935
Journal Information:
Journal of Applied Physics, Vol. 86, Issue 2; Other Information: PBD: 15 Jul 1999; Related Information: Jul. 15, 1999
Country of Publication:
United States
Language:
English

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