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Title: Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons

Journal Article · · Ultramicroscopy
 [1];  [2];  [3]
  1. ShanghaiTech Univ. (China)
  2. City Univ. of Hong Kong (China)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)

Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a smallsized laboratory for ultrafast observations and measurements.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0012704
OSTI ID:
1485441
Alternate ID(s):
OSTI ID: 1724314
Report Number(s):
BNL-209675-2018-JAAM
Journal Information:
Ultramicroscopy, Vol. 194, Issue C; ISSN 0304-3991
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 14 works
Citation information provided by
Web of Science

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