Optimal Parameters of High Energy Ion Microprobe Systems Comprised of Oxford Lenses

Journal Article · Tue Mar 10 04:00:00 EDT 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3120035· OSTI ID:21289539

Riner, Josh; Basnet, Gobind; Glass, Gary A ^[1]; Dias, Johnny F ^[2]; Dymnikov, Alexander D ^[3]

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1. Louisiana Accelerator Center/Physics Dept, University of Louisiana at Lafayette, P.O. Box 42410, Lafayette LA 70504-2410 (United States)
2. Instituto de Fisica, UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL, Av. Bento Goncalves, 9500, C.P. 15051, Porto Alegre Rio Grande do Sul 91501-970 (Brazil)
3. Louisiana Accelerator Center, University of Louisiana at Lafayette, P.O. Box 42410, Lafayette LA 70504-2410 (United States)

Focusing of ion beams of MeV energy until now has been mostly accomplished by magnetic quadrupole lenses in different configurations: doublet, triplet, quadruplet and quintuplet. Many focusing systems are two-parametric focusing systems, i.e., systems having two field parameters (two excitations). The simplest two parametric focusing system, other than the doublet, is a two parametric triplet which can consist of two different configurations: (1) an Oxford configuration in which the focusing (F) and defocusing (D) capabilities of the lenses in one plane alternate F-D-F whereas the lens strengths are ordered as A-A-B, and (2) a triplet in which the focusing and defocusing capabilities of the lenses in one plane also alternate F-D-F but the lens strengths are ordered as A-B-A. Experimental results of a comparison of system parameters for these two focusing configurations, including demagnifications, magnet current, and slit settings will be shown. Both configurations utilized the Oxford Microbeams, Ltd. 10 cm long magnetic quadrupole lenses.

• OSTI ID: 21289539
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1099; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM FOCUSING MAGNETS
BEAM OPTICS
COMPARATIVE EVALUATIONS
ELECTROMAGNETIC LENSES
ELECTRON PROBES
EXCITATION
ION BEAMS
ION MICROPROBE ANALYSIS
MEV RANGE
QUADRUPOLES
TRIPLETS