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Title: Wafer-scale pixelated detector system

Patent ·
OSTI ID:1482172
; ;

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.

Research Organization:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-07CH11359
Assignee:
Fermi Research Alliance, LLC (Batavia, IL)
Patent Number(s):
10,084,983
Application Number:
15/167,595
OSTI ID:
1482172
Resource Relation:
Patent File Date: 2016 May 27
Country of Publication:
United States
Language:
English

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