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Office of Scientific and Technical Information
 

Wafer-scale pixelated detector system

Patent ·
OSTI ID:1482172
; ;

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.

Research Organization:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-07CH11359
Assignee:
Fermi Research Alliance, LLC (Batavia, IL)
Patent Number(s):
10,084,983
Application Number:
15/167,595
OSTI ID:
1482172
Country of Publication:
United States
Language:
English

References (3)

A Dynamic Slew Correction Circuit for Low Noise Silicon Detector Pre-amplifiers journal June 2012
Challenges in chip design for the AGIPD detector
  • Shi, X.; Dinapoli, R.; Henrich, B.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 624, Issue 2, p. 387-391 https://doi.org/10.1016/j.nima.2010.05.038
journal December 2010
Development of the LPD, a high dynamic range pixel detector for the European XFEL conference October 2012

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