Switching Reliability Characterization of Vertical GaN PiN Diodes.

Conference · Sun Oct 01 00:00:00 EDT 2017

OSTI ID:1480182

Slobodyan, Oleksiy; Sandoval, Stephanie; Flicker, Jack David; Kaplar, Robert; Matthews, Christopher; Van Heukelom, Michael; Atcitty, Stanley; Aktas, O.; Kizilyalli, I. C.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE Office of Electricity Delivery and Energy Reliability (OE), Power Systems Engineering Research and Development (R&D) (OE-10)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1480182
• Report Number(s): SAND2017-11164C; 658089
• Country of Publication: United States
• Language: English