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Comparison of pnp and npn InGaAlAs/InGaAs heterojunction bipolar

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.586901· OSTI ID:147056
;  [1]
  1. AT & T Bell Laboratories, Holmdel, NJ (United States)

The molecular-beam epitaxial growth conditions and characteristics of npn and pnp heterojunction bipolar transistors in the InGaAlAs/InGaAs material system are described. Direct-current current gains of more than 15 000 have been obtained for npn heterojunction bipolar transistors (HBTs). pnp HBTs have a larger breakdown voltage compared to equivalent npn HBTs. A novel pnp HBT structure in which a strained hole filter is placed just above the base to inject light holes preferentially is proposed. The high speed performance of pnp HBTs is at present limited by emitter series resistance. 12 refs., 3 figs.

OSTI ID:
147056
Report Number(s):
CONF-9210296--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 3 Vol. 11; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English

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