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Investigation of the Impact of Illumination on the Polarization-Type Potential-Induced Degradation of Crystalline Silicon Photovoltaic Modules

Journal Article · · IEEE Journal of Photovoltaics
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  1. Solar Research Inst. of Singapore (Singapore)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States)
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Accelerated potential-induced degradation (PID) testing of photovoltaic modules is conventionally conducted in the dark and at high temperature and humidity levels without considering the influence of illumination. This study investigates the impact of illumination on the polarization-type PID (PID-p) on two different types of encapsulated (glass/backsheet) crystalline silicon solar cells: 1) n-type bifacial passivated emitter rear totally diffused (the front side is facing glass and PID-stressed); and 2) p-type bifacial passivated emitter and rear cell (the rear side is facing glass and PID-stressed). The samples are stressed under the conditions of -1000 V, 40 degrees C, and 40% relative humidity and at different irradiance levels (xenon lamps). While the type-A modules show no reduction in PID-p sensitivity under illumination up to 800 W/m2, PID-p in the type-B modules is arrested by the light at an irradiance level as low as 10 W/m2. Furthermore, PID-degraded type-B modules (degradation induced in the dark) exhibit a rapid recovery (full recovery in 20 min) upon exposure to light (40 W/m2). External quantum efficiency measurements on the type-B modules show that ultraviolet from 300 to 400 nm is mainly responsible for the fast recovery.
Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1461374
Report Number(s):
NREL/JA--5K00-71980
Journal Information:
IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 5 Vol. 8; ISSN 2156-3381
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

Cited By (3)

Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential‐Induced Degradation at the Rear Side journal August 2019
Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential‐Induced Degradation at the Rear Side journal July 2019
Local Corrosion of Silicon as Root Cause for Potential‐Induced Degradation at the Rear Side of Bifacial PERC Solar Cells journal May 2019

Figures / Tables (9)

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Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
crystalline silicon solar cells
n-passivated emitter rear totally diffused (PERT) bifacial solar cells
p-type bifacial PERC solar cells
photovoltaic (PV) module reliability
potential-induced degradation (PID)
surface polarization