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Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module

Conference ·

Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m2 and 6.2% at 200 W/m2. Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
DOE Contract Number:
AC36-08GO28308
OSTI ID:
2309703
Report Number(s):
NREL/CP-5K00-88874; MainId:89653; UUID:ca1b9392-ef9b-41cb-8ff1-f80aff87e7ae; MainAdminId:71869
Resource Relation:
Conference: Presented at the 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 11-16 June 2023, San Juan, Puerto Rico; Related Information: 86992
Country of Publication:
United States
Language:
English

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