Layer-dependent measurements of electronic band alignment for individual MoS2 flakes supported on SiO2 using photoemission electron microscopy (PEEM) with deep ultraviolet illumination.
Conference
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OSTI ID:1456480
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1456480
- Report Number(s):
- SAND2017-3744C; 652352
- Country of Publication:
- United States
- Language:
- English
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