Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier

Klein, Spencer; Innes, Walter; Price, John C.

doi:10.1063/1.1138531

Title: Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier

Journal Article · Sat Sep 01 00:00:00 EDT 1984 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1138531· OSTI ID:1447417

Klein, Spencer; Innes, Walter; Price, John C.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: AC02-76SF00515

OSTI ID:: 1447417

Report Number(s):: SLAC-PUB-3450

Journal Information:: Review of Scientific Instruments, Vol. 56, Issue 10; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

References (8)

Gate noise in field effect transistors at moderately high frequencies Van Der Ziel, A. Proceedings of the IEEE, Vol. 51, Issue 3 https://doi.org/10.1109/PROC.1963.1849	journal	January 1963
Very low noise cooled audiofrequency preamplifier for gravitational research Bordoni, F.; Maggi, G.; Ottaviano, A. Review of Scientific Instruments, Vol. 52, Issue 7 https://doi.org/10.1063/1.1136712	journal	July 1981
Energy-Dependent Losses in Pulsed-Feedback Preamplifiers Landis, Donald A.; Madden, Norman W.; Goulding, Fred S. IEEE Transactions on Nuclear Science, Vol. 26, Issue 1 https://doi.org/10.1109/TNS.1979.4329670	journal	January 1979
Transistor Reset Preamplifier for High Rate High Resolution Spectroscopy Landis, D. A.; Cork, C. P.; Madden, N. W. IEEE Transactions on Nuclear Science, Vol. 29, Issue 1 https://doi.org/10.1109/TNS.1982.4335922	journal	January 1982
Anomalous noise behavior of the junction-gate field-effect transistor at low temperatures Klaassen, F. M.; Robinson, J. R. IEEE Transactions on Electron Devices, Vol. 17, Issue 10 https://doi.org/10.1109/T-ED.1970.17086	journal	October 1970
Theory of low-frequency generation noise in junction-gate field-effect transistors Sah, C. T. Proceedings of the IEEE, Vol. 52, Issue 7 https://doi.org/10.1109/PROC.1964.3123	journal	January 1964
Thermal Noise in Field-Effect Transistors Der Ziel, A. Proceedings of the IRE, Vol. 50, Issue 8 https://doi.org/10.1109/JRPROC.1962.288221	journal	August 1962
Electrometer designs for use in an unbound-quark search Williams, E. R.; Gillies, G. T. Lettere Al Nuovo Cimento Series 2, Vol. 37, Issue 15 https://doi.org/10.1007/BF02751781	journal	August 1983

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