Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier
Journal Article
·
· Rev. Sci. Instrum.; (United States)
We describe a high-impedance audiofrequency preamplifier and present audiofrequency noise spectra for 2N4416 and U311 JFETs in a temperature range from room temperature to 80 K. It is found that optimum noise performance is obtained at -140/sup 0/C. We present an analysis of some of the sources of noise. Amplifier input capacitance is also measured and discussed.
- Research Organization:
- Stanford Linear Accelerator Center, Stanford University, Stanford, California 94305
- OSTI ID:
- 5411276
- Journal Information:
- Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 56:10; ISSN RSINA
- Country of Publication:
- United States
- Language:
- English
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