Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Maia Mapper: high definition XRF imaging in the lab

Journal Article · · Journal of Instrumentation
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [3];  [3];  [4]
  1. Commonwealth Scientific and Industrial Research Organisation, Clayton, VIC (Australia)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Excillum AB, Kista (Sweden)
  4. XOS, East Greenbush, NY (United States)
Here, Maia Mapper is a laboratory μXRF mapping system for efficient elemental imaging of drill core sections serving minerals research and industrial applications. It targets intermediate spatial scales, with imaging of up to ~80 M pixels over a 500×150 mm2 sample area. It brings together (i) the Maia detector and imaging system, with its large solid-angle, event-mode operation, millisecond pixel transit times in fly-scan mode and real-time spectral deconvolution and imaging, (ii) the high brightness MetalJet D2 liquid metal micro-focus X-ray source from Excillum, and (iii) an efficient XOS polycapillary lens with a flux gain ~15,900 at 21 keV into a ~32 μm focus, and (iv) a sample scanning stage engineered for standard drill-core sections. Count-rates up to ~3 M/s are observed on drill core samples with low dead-time up to ~1.5%. Automated scans are executed in sequence with display of deconvoluted element component images accumulated in real-time in the Maia detector. Application images on drill core and polished rock slabs illustrate Maia Mapper capabilities as part of the analytical workflow of the Advanced Resource Characterisation Facility, which spans spatial dimensions from ore deposit to atomic scales.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
SC0012704
OSTI ID:
1438318
Alternate ID(s):
OSTI ID: 22885080
Report Number(s):
BNL--205677-2018-JAAM
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 03 Vol. 13; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

References (21)

X-ray tube spectra journal July 1999
Quantitative trace element imaging using PIXE and the nuclear microprobe journal January 2000
A remote controlled XRF system for field analysis of cultural heritage objects journal July 2008
MIRRORCLE type tabletop synchrotron light source realizing micron-order focus point: MIRRORCLE type tabletop synchrotron light source journal June 2012
Quantified, multi-scale X-ray fluorescence element mapping using the Maia detector array: application to mineral deposit studies journal November 2014
Trends in hard X-ray fluorescence mapping: environmental applications in the age of fast detectors journal March 2011
Trace elements in natural azurite pigments found in illuminated manuscript leaves investigated by synchrotron x-ray fluorescence and diffraction mapping journal June 2017
Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle
  • Ryan, C. G.; Kirkham, R.; Hough, R. M.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 619, Issue 1-3 https://doi.org/10.1016/j.nima.2009.11.035
journal July 2010
Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation journal July 2016
Bright spatially coherent synchrotron X-rays from a table-top source journal October 2010
Optimization of mobile scanning macro-XRF systems for the in situ investigation of historical paintings journal January 2011
Real-time elemental imaging of large dimension paintings with a novel mobile macro X-ray fluorescence (MA-XRF) scanning technique journal January 2017
Generation of hard x rays by ultrafast terawatt lasers journal January 2001
The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material
  • Ryan, C. G.; Siddons, D. P.; Kirkham, R.
  • X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 20th International Congress, AIP Conference Proceedings https://doi.org/10.1063/1.3399266
conference January 2010
The Maia Spectroscopy Detector System: Engineering for Integrated Pulse Capture, Low-Latency Scanning and Real-Time Processing
  • Kirkham, R.; Dunn, P. A.; Kuczewski, A. J.
  • SRI 2009, 10TH INTERNATIONAL CONFERENCE ON RADIATION INSTRUMENTATION, AIP Conference Proceedings https://doi.org/10.1063/1.3463181
conference January 2010
The X-ray Fluorescence Microscopy Beamline at the Australian Synchrotron conference January 2011
A 24 keV liquid-metal-jet x-ray source for biomedical applications journal December 2011
The Munich Compact Light Source: initial performance measures journal July 2016
Fast X-ray microfluorescence imaging with submicrometer-resolution integrating a Maia detector at beamline P06 at PETRA III journal October 2016
The Maia detector array and x-ray fluorescence imaging system: locating rare precious metal phases in complex samples conference September 2013
Bright Coherent Ultrahigh Harmonics in the keV X-ray Regime from Mid-Infrared Femtosecond Lasers journal June 2012

Cited By (2)

Confocal micro-X-ray fluorescence spectroscopy with a liquid metal jet source journal January 2018
Atomic Spectrometry Update – a review of advances in environmental analysis journal January 2019

Similar Records

The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material
Conference · Tue May 25 00:00:00 EDT 2010 · OSTI ID:1009071

The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material
Journal Article · Tue Apr 06 00:00:00 EDT 2010 · AIP Conference Proceedings · OSTI ID:21371776

High definition large area mapping of geological samples using a Maia detector array in the Nuclear Microprobe
Journal Article · Fri Apr 19 20:00:00 EDT 2019 · Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms · OSTI ID:1547290