The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material

Conference · Tue May 25 00:00:00 EDT 2010

DOI:https://doi.org/10.1063/1.3399266· OSTI ID:1009071

Ryan, C G; Siddons, D P; Kirkham, R; Dunn, P A; Kuczewski, A; Moorhead, G; De Geronimo, G; Paterson, D J; de Jonge, M D; Hough, R M; Lintern, M J; Howard, D L; Kappen, P; Cleverley, J ^[1]

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1. Aust. Synch.

Motivated by the need for megapixel high definition trace element imaging to capture intricate detail in natural material, together with faster acquisition and improved counting statistics in elemental imaging, a large energy-dispersive detector array called Maia has been developed by CSIRO and BNL for SXRF imaging on the XFM beamline at the Australian Synchrotron. A 96 detector prototype demonstrated the capacity of the system for real-time deconvolution of complex spectral data using an embedded implementation of the Dynamic Analysis method and acquiring highly detailed images up to 77 M pixels spanning large areas of complex mineral sample sections.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
• Sponsoring Organization: USDOE
• OSTI ID: 1009071
• Resource Relation: Conference: X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 20th International Congress;15–18 September 2009;Karlsruhe, Germany
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MINERALS
TRACE AMOUNTS
MULTI-ELEMENT ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
SYNCHROTRON RADIATION
PERFORMANCE