Selective, electrochemical etching of a semiconductor
Methods for facilitating fabricating semiconductor structures are provided which include: providing a multilayer structure including a semiconductor layer, the semiconductor layer including a dopant and having an increased conductivity; selectively increasing, using electrochemical processing, porosity of the semiconductor layer, at least in part, the selectively increasing porosity utilizing the increased conductivity of the semiconductor layer; and removing, at least in part, the semiconductor layer with the selectively increased porosity from the multilayer structure. By way of example, the selectively increasing porosity may include selectively, anodically oxidizing, at least in part, the semiconductor layer of the multilayer structure.
- Research Organization:
- Rensselaer Polytechnic Institute, Troy, NY (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AR0000304
- Assignee:
- Rensselaer Polytechnic Institute, Troy, NY
- Patent Number(s):
- 9,922,838
- Application Number:
- 15/116,041
- OSTI ID:
- 1429084
- Country of Publication:
- United States
- Language:
- English
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