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Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.2748674· OSTI ID:1427012
 [1];  [2];  [2];  [2];  [1]
  1. Ktech Corp., Albuquerque, NM (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1427012
Report Number(s):
SAND2007-0241J; 524295
Journal Information:
Review of Scientific Instruments, Vol. 78, Issue 6; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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Measurement and analysis of x-ray absorption in Al and MgF 2 plasmas heated by Z -pinch radiation journal December 2005
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Time- and space-resolved elliptical crystal spectrometers for high energy density physics research journal October 2004

Cited By (1)

Diagnosis of x-ray heated Mg/Fe opacity research plasmas journal November 2008