Impact of Silicon Doping on Low-Frequency Charge Noise and Conductance Drift in Nanostructures
Journal Article
·
· Physical Review Applied
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0006671
- OSTI ID:
- 1425719
- Journal Information:
- Physical Review Applied, Journal Name: Physical Review Applied Vol. 9 Journal Issue: 3; ISSN 2331-7019
- Publisher:
- American Physical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 4 works
Citation information provided by
Web of Science
Web of Science
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