Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration

Subedi, Indra; Silverman, Timothy J.; Deceglie, Michael G.; Podraza, Nikolas J.

doi:10.1002/pssa.201700480

Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration

Journal Article · Wed Oct 18 00:00:00 EDT 2017 · Physica Status Solidi. A, Applications and Materials Science

DOI:https://doi.org/10.1002/pssa.201700480· OSTI ID:1418122

^[1]; Silverman, Timothy J. ^[2]; Deceglie, Michael G. ^[2]; Podraza, Nikolas J. ^[1]

Univ. of Toledo, OH (United States). Wright Center for Photovoltaics Innovation and Commercialization (PVIC)
National Renewable Energy Lab. (NREL), Golden, CO (United States)

Al is a commonly used material for rear side metallization in commercial silicon (Si) wafer solar cells. In this study, through-the-silicon spectroscopic ellipsometry is used in a test sample to measure Al+Si interface optical properties like those in Si wafer solar cells. Two different spectroscopic ellipsometers are used for measurement of Al+Si interface optical properties over the 1128-2500 nm wavelength range. For validation, the measured interface optical properties are used in a ray tracing simulation over the 300-2500 nm wavelength range for an encapsulated Si solar cell having random pyramidal texture. The ray tracing model matches well with the measured total reflectance at normal incidence of a commercially available Si module. The Al+Si optical properties presented here enable quantitative assessment of major irradiance/current flux losses arising from reflection and parasitic absorption in encapsulated Si solar cells.

View Accepted Manuscript (DOE)

Research Organization:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE; USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)

Grant/Contract Number:: AC36-08GO28308

OSTI ID:: 1418122

Alternate ID(s):: OSTI ID: 1400003

Report Number(s):: NREL/JA--5J00-68655

Journal Information:: Physica Status Solidi. A, Applications and Materials Science, Journal Name: Physica Status Solidi. A, Applications and Materials Science Journal Issue: 12 Vol. 214; ISSN 1862-6300

Publisher:: WileyCopyright Statement

Country of Publication:: United States

Language:: English

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Photogenerated Carrier Transport Properties in Silicon Photovoltaics Uprety, Prakash; Subedi, Indra; Junda, Maxwell M. Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-55173-z	journal	December 2019

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14 SOLAR ENERGY
36 MATERIALS SCIENCE
aluminum
interfaces
optical properties
silicon
solar cells
spectroscopic ellipsometry

Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration

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References (27)

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