skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint

Abstract

A fundamental change in the analysis for the accelerated stress testing of thin-film modules is proposed, whereby power changes due to metastability and other effects that may occur due to the thermal history are removed from the power measurement that we obtain as a function of the applied stress factor. The power of reference modules normalized to an initial state - undergoing the same thermal and light- exposure history but without the applied stress factor such as humidity or voltage bias - is subtracted from that of the stressed modules. For better understanding and appropriate application in standardized tests, the method is demonstrated and discussed for potential-induced degradation testing in view of the parallel-occurring but unrelated physical mechanisms that can lead to confounding power changes in the module.

Authors:
 [1];  [1];  [2]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
  2. Aalborg University
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1399660
Report Number(s):
NREL/CP-5J00-68665
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the 2017 IEEE Photovoltaic Specialists Conference (PSVC), 25-30 June 2017, Washington, D.C.
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; thin-film; stress testing; PV; modules; induced degradation testing; module power changes

Citation Formats

Hacke, Peter L, Johnston, Steven, and Spataru, Sergiu. Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint. United States: N. p., 2017. Web.
Hacke, Peter L, Johnston, Steven, & Spataru, Sergiu. Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint. United States.
Hacke, Peter L, Johnston, Steven, and Spataru, Sergiu. Sun . "Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint". United States. doi:. https://www.osti.gov/servlets/purl/1399660.
@article{osti_1399660,
title = {Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint},
author = {Hacke, Peter L and Johnston, Steven and Spataru, Sergiu},
abstractNote = {A fundamental change in the analysis for the accelerated stress testing of thin-film modules is proposed, whereby power changes due to metastability and other effects that may occur due to the thermal history are removed from the power measurement that we obtain as a function of the applied stress factor. The power of reference modules normalized to an initial state - undergoing the same thermal and light- exposure history but without the applied stress factor such as humidity or voltage bias - is subtracted from that of the stressed modules. For better understanding and appropriate application in standardized tests, the method is demonstrated and discussed for potential-induced degradation testing in view of the parallel-occurring but unrelated physical mechanisms that can lead to confounding power changes in the module.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Oct 01 00:00:00 EDT 2017},
month = {Sun Oct 01 00:00:00 EDT 2017}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: