The differential absorption hard x-ray spectrometer at the Z facility

Journal Article · Thu Aug 03 00:00:00 EDT 2017 · IEEE Transactions on Plasma Science

DOI:https://doi.org/10.1109/tps.2017.2723347· OSTI ID:1399508

Bell, Kate S. ^[1]; Coverdale, Christine A. ^[1]; Ampleford, David J. ^[1]; Bailey, James E. ^[1]; Loisel, Guillaume ^[1]; Harper-Slaboszewicz, Victor ^[1]; Schwarz, Jens ^[1]; Moy, Kenneth ^[2]

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1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
2. National Security Technologies, LLC. (NSTec), Santa Barbara, CA (United States)

The Differential Absorption Hard X-ray (DAHX) spectrometer is a diagnostic developed to measure time-resolved radiation between 60 keV and 2 MeV at the Z Facility. It consists of an array of 7 Si PIN diodes in a tungsten housing that provides collimation and coarse spectral resolution through differential filters. DAHX is a revitalization of the Hard X-Ray Spectrometer (HXRS) that was fielded on Z prior to refurbishment in 2006. DAHX has been tailored to the present radiation environment in Z to provide information on the power, spectral shape, and time profile of the hard emission by plasma radiation sources driven by the Z Machine.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: AC04-94AL85000
• OSTI ID: 1399508
• Report Number(s): SAND-2017-6847J; 654883
• Journal Information: IEEE Transactions on Plasma Science, Journal Name: IEEE Transactions on Plasma Science Journal Issue: 8 Vol. 45; ISSN 0093-3813
• Publisher: IEEE
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY