skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Near-edge X-ray refraction fine structure microscopy

Abstract

We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.

Authors:
 [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [3]; ORCiD logo [4];  [1];  [1]; ORCiD logo [1];  [5]; ORCiD logo [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Illinois at Chicago, Chicago, IL (United States)
  4. Univ. of Illinois at Chicago, Chicago, IL (United States)
  5. Uppsala Univ., Uppsala (Sweden)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)
OSTI Identifier:
1393120
Alternate Identifier(s):
OSTI ID: 1361767
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 6; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young -Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., and Shapiro, David A.. Near-edge X-ray refraction fine structure microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4975377.
Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young -Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., & Shapiro, David A.. Near-edge X-ray refraction fine structure microscopy. United States. doi:10.1063/1.4975377.
Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young -Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., and Shapiro, David A.. Mon . "Near-edge X-ray refraction fine structure microscopy". United States. doi:10.1063/1.4975377. https://www.osti.gov/servlets/purl/1393120.
@article{osti_1393120,
title = {Near-edge X-ray refraction fine structure microscopy},
author = {Farmand, Maryam and Celestre, Richard and Denes, Peter and Kilcoyne, A. L. David and Marchesini, Stefano and Padmore, Howard and Tyliszczak, Tolek and Warwick, Tony and Shi, Xiaowen and Lee, James and Yu, Young -Sang and Cabana, Jordi and Joseph, John and Krishnan, Harinarayan and Perciano, Talita and Maia, Filipe R. N. C. and Shapiro, David A.},
abstractNote = {We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.},
doi = {10.1063/1.4975377},
journal = {Applied Physics Letters},
number = 6,
volume = 110,
place = {United States},
year = {Mon Feb 06 00:00:00 EST 2017},
month = {Mon Feb 06 00:00:00 EST 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Phospho-olivines as Positive-Electrode Materials for Rechargeable Lithium Batteries
journal, April 1997

  • Padhi, A. K.
  • Journal of The Electrochemical Society, Vol. 144, Issue 4, p. 1188-1194
  • DOI: 10.1149/1.1837571