Near-edge X-ray refraction fine structure microscopy

Farmand, Maryam; Celestre, Richard; Denes, Peter; Kilcoyne, A. L. David; Marchesini, Stefano; Padmore, Howard; Tyliszczak, Tolek; Warwick, Tony; Shi, Xiaowen; Lee, James; Yu, Young -Sang; Cabana, Jordi; Joseph, John; Krishnan, Harinarayan; Perciano, Talita; Maia, Filipe R. N. C.; Shapiro, David A.

doi:10.1063/1.4975377

Title: Near-edge X-ray refraction fine structure microscopy

Journal Article · Mon Feb 06 00:00:00 EST 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4975377· OSTI ID:1393120

Farmand, Maryam ^[1];

^[1]; Denes, Peter ^[1]; Kilcoyne, A. L. David ^[1]; Marchesini, Stefano ^[1]; Padmore, Howard ^[1]; Tyliszczak, Tolek ^[1]; Warwick, Tony ^[1]; Shi, Xiaowen ^[2]; Lee, James ^[2]; Yu, Young -Sang ^[3];

^[4]; Joseph, John ^[1]; Krishnan, Harinarayan ^[1];

^[1]; Maia, Filipe R. N. C. ^[5];

^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Illinois at Chicago, Chicago, IL (United States)
Univ. of Illinois at Chicago, Chicago, IL (United States)
Uppsala Univ., Uppsala (Sweden)

We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.

View Accepted Manuscript (DOE)

View Accepted Manuscript (Publisher)

Cite

Export

Save

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1393120

Alternate ID(s):: OSTI ID: 1361767

Journal Information:: Applied Physics Letters, Vol. 110, Issue 6; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 23 works

Citation information provided by
Web of Science

References (30)

Cluster analysis in soft X-ray spectromicroscopy: Finding the patterns in complex specimens Lerotic, M.; Jacobsen, C.; Gillow, J. B. Journal of Electron Spectroscopy and Related Phenomena, Vol. 144-147 https://doi.org/10.1016/j.elspec.2005.01.158	journal	June 2005
High-resolution chemical imaging of gold nanoparticles using hard x-ray ptychography Hoppe, R.; Reinhardt, J.; Hofmann, G. Applied Physics Letters, Vol. 102, Issue 20 https://doi.org/10.1063/1.4807020	journal	May 2013
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films Collins, B. A.; Cochran, J. E.; Yan, H. Nature Materials, Vol. 11, Issue 6 https://doi.org/10.1038/nmat3310	journal	April 2012
Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source Kilcoyne, A. L. D.; Tyliszczak, T.; Steele, W. F. Journal of Synchrotron Radiation, Vol. 10, Issue 2 https://doi.org/10.1107/S0909049502017739	journal	February 2003
Element-Specific X-Ray Phase Tomography of 3D Structures at the Nanoscale Donnelly, Claire; Guizar-Sicairos, Manuel; Scagnoli, Valerio Physical Review Letters, Vol. 114, Issue 11 https://doi.org/10.1103/PhysRevLett.114.115501	journal	March 2015
Li Conductivity in Li[sub x]MPO[sub 4] (M = Mn, Fe, Co, Ni) Olivine Materials Morgan, D.; Van der Ven, A.; Ceder, G. Electrochemical and Solid-State Letters, Vol. 7, Issue 2 https://doi.org/10.1149/1.1633511	journal	January 2004
Soft X-ray spectromicroscopy using ptychography with randomly phased illumination Maiden, A. M.; Morrison, G. R.; Kaulich, B. Nature Communications, Vol. 4, Issue 1 https://doi.org/10.1038/ncomms2640	journal	April 2013
Characterizing morphology in organic systems with resonant soft X-ray scattering Carpenter, Joshua H.; Hunt, Adrian; Ade, Harald Journal of Electron Spectroscopy and Related Phenomena, Vol. 200 https://doi.org/10.1016/j.elspec.2015.05.006	journal	April 2015
Experimental visualization of lithium diffusion in LixFePO4 Nishimura, Shin-ichi; Kobayashi, Genki; Ohoyama, Kenji Nature Materials, Vol. 7, Issue 9 https://doi.org/10.1038/nmat2251	journal	August 2008
NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space Ade, Harald; Hitchcock, Adam P. Polymer, Vol. 49, Issue 3 https://doi.org/10.1016/j.polymer.2007.10.030	journal	February 2008
Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in Li _x FePO ₄ Yu, Young-Sang; Kim, Chunjoong; Shapiro, David A. Nano Letters, Vol. 15, Issue 7 https://doi.org/10.1021/acs.nanolett.5b01314	journal	June 2015
An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy Howells, M. R.; Beetz, T.; Chapman, H. N. Journal of Electron Spectroscopy and Related Phenomena, Vol. 170, Issue 1-3 https://doi.org/10.1016/j.elspec.2008.10.008	journal	March 2009
Particle Size Dependence of the Ionic Diffusivity Malik, Rahul; Burch, Damian; Bazant, Martin Nano Letters, Vol. 10, Issue 10 https://doi.org/10.1021/nl1023595	journal	October 2010
High-Resolution Scanning X-ray Diffraction Microscopy Thibault, P.; Dierolf, M.; Menzel, A. Science, Vol. 321, Issue 5887 https://doi.org/10.1126/science.1158573	journal	July 2008
Ptychographic X-ray computed tomography at the nanoscale Dierolf, Martin; Menzel, Andreas; Thibault, Pierre Nature, Vol. 467, Issue 7314 https://doi.org/10.1038/nature09419	journal	September 2010
X-ray Linear Dichroism Microscopy Ade, H.; Hsiao, B. Science, Vol. 262, Issue 5138 https://doi.org/10.1126/science.262.5138.1427	journal	November 1993
Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials Ade, Harald; Stoll, Herman Nature Materials, Vol. 8, Issue 4 https://doi.org/10.1038/nmat2399	journal	April 2009
Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering Takahashi, Yukio; Suzuki, Akihiro; Zettsu, Nobuyuki Applied Physics Letters, Vol. 99, Issue 13 https://doi.org/10.1063/1.3644396	journal	September 2011
Chemical Contrast in Soft X-Ray Ptychography Beckers, Mike; Senkbeil, Tobias; Gorniak, Thomas Physical Review Letters, Vol. 107, Issue 20 https://doi.org/10.1103/PhysRevLett.107.208101	journal	November 2011
Chemical composition mapping with nanometre resolution by soft X-ray microscopy Shapiro, David A.; Yu, Young-Sang; Tyliszczak, Tolek Nature Photonics, Vol. 8, Issue 10 https://doi.org/10.1038/nphoton.2014.207	journal	September 2014
Electrode Lithiation: Effects of Particle Size, Electronic Connectivity, and Incoherent Nanoscale Domains on the Sequence of Lithiation in LiFePO ₄ Porous Electrodes (Adv. Mater. 42/2015) Li, Yiyang; Meyer, Sophie; Lim, Jongwoo Advanced Materials, Vol. 27, Issue 42 https://doi.org/10.1002/adma.201570286	journal	November 2015
Soft X-ray microscopy at a spatial resolution better than 15 nm Chao, Weilun; Harteneck, Bruce D.; Liddle, J. Alexander Nature, Vol. 435, Issue 7046 https://doi.org/10.1038/nature03719	journal	June 2005
Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source Bluhm, H.; Andersson, K.; Araki, T. Journal of Electron Spectroscopy and Related Phenomena, Vol. 150, Issue 2-3 https://doi.org/10.1016/j.elspec.2005.07.005	journal	February 2006
Defining the Nanostructured Morphology of Triblock Copolymers Using Resonant Soft X-ray Scattering Wang, Cheng; Lee, Dong Hyun; Hexemer, Alexander Nano Letters, Vol. 11, Issue 9 https://doi.org/10.1021/nl2020526	journal	September 2011
Hard-X-Ray Lensless Imaging of Extended Objects Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G. Physical Review Letters, Vol. 98, Issue 3 https://doi.org/10.1103/PhysRevLett.98.034801	journal	January 2007
Spectromicroscopy of Poly(ethylene terephthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss Rightor, E. G.; Hitchcock, A. P.; Ade, H. The Journal of Physical Chemistry B, Vol. 101, Issue 11 https://doi.org/10.1021/jp9622748	journal	March 1997
Phospho-olivines as Positive-Electrode Materials for Rechargeable Lithium Batteries Padhi, A. K. Journal of The Electrochemical Society, Vol. 144, Issue 4, p. 1188-1194 https://doi.org/10.1149/1.1837571	journal	April 1997
Chemical contrast in X-ray microscopy and spatially resolved XANES spectroscopy of organic specimens Ade, H.; Zhang, X.; Cameron, S. Science, Vol. 258, Issue 5084 https://doi.org/10.1126/science.1439809	journal	November 1992
Cluster analysis of soft X-ray spectromicroscopy data Lerotic, M.; Jacobsen, C.; Schäfer, T. Ultramicroscopy, Vol. 100, Issue 1-2 https://doi.org/10.1016/j.ultramic.2004.01.008	journal	July 2004
Atomic-Scale Investigation of Defects, Dopants, and Lithium Transport in the LiFePO ₄ Olivine-Type Battery Material Islam, M. Saiful; Driscoll, Daniel J.; Fisher, Craig A. J. Chemistry of Materials, Vol. 17, Issue 20 https://doi.org/10.1021/cm050999v	journal	October 2005

Cited By (4)

X-ray Microscopy Jacobsen, Chris Cambridge University Press https://doi.org/10.1017/9781139924542	book	January 2019
X-ray ptychography on low-dimensional hard-condensed matter materials Shi, Xiaowen; Burdet, Nicolas; Chen, Bo Applied Physics Reviews, Vol. 6, Issue 1 https://doi.org/10.1063/1.5045131	journal	March 2019
Spatially correlated coherent diffractive imaging method Tao, Xulei; Xu, Zijian; Liu, Haigang Applied Optics, Vol. 57, Issue 22 https://doi.org/10.1364/ao.57.006527	journal	January 2018
X-ray microscopy Cosslett, V. E. Reports on Progress in Physics, Vol. 28, Issue 1 https://doi.org/10.1088/0034-4885/28/1/311	journal	July 1965

Similar Records

Iterative X-ray spectroscopic ptychography

Journal Article · Wed Jul 08 00:00:00 EDT 2020 · Journal of Applied Crystallography (Online) · OSTI ID:1393120

Chang, Huibin; Rong, Ziqin; Enfedaque, Pablo; +1 more

Measuring spectroscopy and magnetism of extracted and intracellular magnetosomes using soft X-ray ptychography

Journal Article · Wed Dec 07 00:00:00 EST 2016 · Proceedings of the National Academy of Sciences of the United States of America · OSTI ID:1393120

Zhu, Xiaohui; Hitchcock, Adam P.; Bazylinski, Dennis A.; +7 more

Four-Dimensional Imaging of ZnO-Coated Alumina Aerogels by Scanning Transmission X-ray Microscopy and Ptychographic Tomography

Journal Article · Tue Oct 16 00:00:00 EDT 2018 · Journal of Physical Chemistry. C · OSTI ID:1393120

Wu, Juan; Zhu, Xiaohui; Shapiro, David A.; +7 more

Related Subjects

36 MATERIALS SCIENCE

Title: Near-edge X-ray refraction fine structure microscopy

Citation Formats

References (30)

Cited By (4)

Similar Records

Related Subjects