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Title: Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade

Abstract

The proposed upgrade of the Advanced Photon Source (APS) to a multibend-achromat lattice relies on the use of swap-out injection to accommodate the small dynamic acceptance, allow use of unusual insertion devices, and minimize collective effects at high single-bunch charge. This, combined with the short beam lifetime, will make injector reliability even more important than it is for top-up operation. We used historical data for the APS injector complex to obtain probability distributions for injector up-time and down-time durations. Using these distributions, we simulated several years of swap-out operation for the upgraded lattice for several operatingmodes. The results indicate that obtaining very high availability of beam in the storage ring will require improvements to injector reliability.

Authors:
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1389060
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 2016 North American Particle Accelerator Conference, 10/09/16 - 10/14/16, Chicago, IL, US
Country of Publication:
United States
Language:
English

Citation Formats

Borland, M. Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade. United States: N. p., 2017. Web. doi:10.18429.
Borland, M. Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade. United States. doi:10.18429.
Borland, M. Thu . "Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade". United States. doi:10.18429. https://www.osti.gov/servlets/purl/1389060.
@article{osti_1389060,
title = {Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade},
author = {Borland, M.},
abstractNote = {The proposed upgrade of the Advanced Photon Source (APS) to a multibend-achromat lattice relies on the use of swap-out injection to accommodate the small dynamic acceptance, allow use of unusual insertion devices, and minimize collective effects at high single-bunch charge. This, combined with the short beam lifetime, will make injector reliability even more important than it is for top-up operation. We used historical data for the APS injector complex to obtain probability distributions for injector up-time and down-time durations. Using these distributions, we simulated several years of swap-out operation for the upgraded lattice for several operatingmodes. The results indicate that obtaining very high availability of beam in the storage ring will require improvements to injector reliability.},
doi = {10.18429},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jun 01 00:00:00 EDT 2017},
month = {Thu Jun 01 00:00:00 EDT 2017}
}

Conference:
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  • The proposed Advance Photon Source Upgrade (APS-U) employs a multi-bend achromat (MBA) lattice to increase the photon brightness by two to three orders of magnitude. One of the main design challenges of the upgrade is to minimize rf heating and collective instabilities associated with the impedance of small-aperture vacuum components. As part of this effort, my research focuses on impedance measurement and simulation of various MBA vacuum components. Here, we present the summary of the impedance contributions for the APS-U and describe our planned impedance measurement technique, including some measurement results for the non-evaporative getter (NEG)-coated copper chamber and simulationmore » results for other critical components using a novel Goubau line (G-line) set up.« less
  • The proposed Advance Photon Source Upgrade (APS-U) employs a multi-bend achromat (MBA) lattice to increase the photon brightness by two to three orders of magnitude. One of the main design challenges of the upgrade is to minimize rf heating and collective instabilities associated with the impedance of small-aperture vacuum components. As part of this effort, my research focuses on impedance measurement and simulation of various MBA vacuum components. Here, we present the summary of the impedance contributions for the APS-U and describe our planned impedance measurement technique, including some measurement results for the non-evaporative getter (NEG)-coated copper chamber and simulationmore » results for other critical components using a novel Goubau line (G-line) set up.« less
  • The APS linac modulators provide DC pulses to Thales 35/45-MW klystrons. The modulators are pulse forming network (PFN)-type pulsers with EMI 40-kV switch-mode charging supplies. The PFN consists of two 8-cell lines connected in parallel. EEV CX1836A thyratrons are used as discharge switches. The PSpice simulation of the modulators using OrCAD release 9.1 made it possible to find appropriate parameters of RC circuits that reduce high-frequency ringing of the pulse transformer primary voltage. In order to improve pulse top flatness (originally {+-}3%), new coils were built and installed. The coils allow discrete tuning of pulse waveforms by changing the amountmore » of used turns. The advantage of two parallel-line PFN configurations was also used. An equivalent method using a low-voltage generator was used for PFN fine tuning.« less
  • No abstract prepared.
  • A vertical on-axis injection scheme has been proposed for the hybrid seven-bend-achromat (H7BA) [1] Advanced Photon Source upgrade (APSU) lattice. In order to evaluate the injection performance, various errors, such as injection beam jitter, optical mismatch and errors, and injection element errors have been investigated and their significance has been discovered. Injection efficiency is then simulated under different error levels. Based on these simulation results, specifications and an error-budget for individual systems have been defined.