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Title: Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade

Abstract

The proposed upgrade of the Advanced Photon Source (APS) to a multibend-achromat lattice relies on the use of swap-out injection to accommodate the small dynamic acceptance, allow use of unusual insertion devices, and minimize collective effects at high single-bunch charge. This, combined with the short beam lifetime, will make injector reliability even more important than it is for top-up operation. We used historical data for the APS injector complex to obtain probability distributions for injector up-time and down-time durations. Using these distributions, we simulated several years of swap-out operation for the upgraded lattice for several operatingmodes. The results indicate that obtaining very high availability of beam in the storage ring will require improvements to injector reliability.

Authors:
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1389060
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 2016 North American Particle Accelerator Conference, 10/09/16 - 10/14/16, Chicago, IL, US
Country of Publication:
United States
Language:
English

Citation Formats

Borland, M. Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade. United States: N. p., 2017. Web. doi:10.18429.
Borland, M. Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade. United States. doi:10.18429.
Borland, M. Thu . "Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade". United States. doi:10.18429. https://www.osti.gov/servlets/purl/1389060.
@article{osti_1389060,
title = {Simulation of Swap-Out Reliability For The Advance Photon Source Upgrade},
author = {Borland, M.},
abstractNote = {The proposed upgrade of the Advanced Photon Source (APS) to a multibend-achromat lattice relies on the use of swap-out injection to accommodate the small dynamic acceptance, allow use of unusual insertion devices, and minimize collective effects at high single-bunch charge. This, combined with the short beam lifetime, will make injector reliability even more important than it is for top-up operation. We used historical data for the APS injector complex to obtain probability distributions for injector up-time and down-time durations. Using these distributions, we simulated several years of swap-out operation for the upgraded lattice for several operatingmodes. The results indicate that obtaining very high availability of beam in the storage ring will require improvements to injector reliability.},
doi = {10.18429},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jun 01 00:00:00 EDT 2017},
month = {Thu Jun 01 00:00:00 EDT 2017}
}

Conference:
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