Role of the interface on radiation damage in the SrTiO3/LaAlO3 heterostructure under Ne2+ ion irradiation
Journal Article
·
· Journal of Applied Physics
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
We systematically investigated the microstructural evolution of heteroepitaxial SrTiO3 (STO) thin films grown on a single crystal LaAlO3 (LAO) (001) substrate, focusing on the response of the STO/LAO interface to Ne2+ irradiation at room temperature. Cross sectional transmission electron microscope (TEM) analysis reveals that the LAO crystal amorphizes first after a relatively low dose of damage followed by the amorphization of the STO film after irradiation to a higher dose. While the critical dose to amorphize differs between each material, amorphization begins at the interface and proceeds outward in both cases. Thus, a crystalline/amorphous interface first forms at the STO/LAO interface by a dose of 1 dpa, and then an amorphous/amorphous interface forms when the dose reaches 3 dpa. Scanning TEM and x-ray energy dispersive spectroscopy indicate no significant heavy cation elemental diffusion, though electron energy loss spectroscopy reveals a redistribution of oxygen across the film/substrate interface after Ne2+ irradiation. Atomistic calculations are used to interpret the experimental findings in terms of the defect properties in each of the two component phases.
- Research Organization:
- Energy Frontier Research Centers (EFRC) (United States). Center for Materials at Irradiation and Mechanical Extremes (CMIME)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- AC52-06NA25396
- OSTI ID:
- 1383572
- Alternate ID(s):
- OSTI ID: 22271116
OSTI ID: 1149776
OSTI ID: 1161415
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 12 Vol. 115; ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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