X-ray diffraction microscopy of lithiated silicon microstructures
- Research Organization:
- Energy Frontier Research Centers (EFRC) (United States). Center for Electrical Energy Storage (CEES)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1382014
- Journal Information:
- Applied Physics Letters, Vol. 102, Issue 13; Related Information: CEES partners with Argonne National Laboratory (lead); University of Illinois, Urbana-Champaign; Northwest University; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
Similar Records
High-energy x-ray diffraction microscopy study of deformation microstructures in neutron-irradiated polycrystalline Fe-9%Cr
Probing microstructure dynamics with x-ray diffraction microscopy.
Statistics of high purity nickel microstructure from high energy x-ray diffraction microscopy.
Journal Article
·
Mon Jun 04 00:00:00 EDT 2018
· Journal of Nuclear Materials
·
OSTI ID:1382014
+3 more
Probing microstructure dynamics with x-ray diffraction microscopy.
Journal Article
·
Tue Apr 01 00:00:00 EDT 2008
· J. Eng. Mater. Technol.
·
OSTI ID:1382014
+4 more
Statistics of high purity nickel microstructure from high energy x-ray diffraction microscopy.
Journal Article
·
Thu Jan 01 00:00:00 EST 2009
· Comput. Mater. Con.
·
OSTI ID:1382014
+4 more