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Title: Ambient-Pressure X-ray Photoelectron Spectroscopy to Characterize the Solid/Liquid Interface: Probing the Electrochemical Double Layer

Journal Article · · Synchrotron Radiation News
 [1];  [2];  [3]
  1. Helmholtz-Zentrum Berlin (HZB), (Germany)
  2. Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Microsystem and Information Technology, State Key Lab. of Functional Materials for Infomatics; Shanghai Tech Univ., Shanghai (China). School of Physical Science and Technology, Division of Condensed Matter Physics and Photon Science
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Joint Center for Energy Storage Research
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Ambient-pressure X-ray photoelectron spectroscopy (APXPS) has contributed greatly to a wide range of research fields, including environmental science, catalysis, and electrochemistry, to name a few. The use of this technique at synchrotron facilities primarily focused on probing the solid/gas interface; however, it quickly advanced to the probing of liquid/vapor interfaces and solid/liquid interfaces through an X-ray-transparent window. Most recently, combining APXPS with “Tender” X-rays (~2.5 keV to 8 keV) on beamline 9.3.1 at the Advanced Light Source in Lawrence Berkeley National Laboratory (which can generate photoelectrons with much longer inelastic mean free paths) has enabled us to probe the solid/liquid interface without needing a window. This innovation allows us to probe interfacial chemistries of electrochemically controlled solid/liquid interfaces undergoing charge transfer reactions. Lastly, these advancements have transitioned APXPS from a traditional surface science tool to an essential interface science technique.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1379761
Journal Information:
Synchrotron Radiation News, Vol. 30, Issue 2; ISSN 0894-0886
Publisher:
Taylor & FrancisCopyright Statement
Country of Publication:
United States
Language:
English

References (11)

Using “Tender” X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface journal May 2015
A combined droplet train and ambient pressure photoemission spectrometer for the investigation of liquid/vapor interfaces journal January 2008
In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents journal September 2013
In situ investigation of electrochemical devices using ambient pressure photoelectron spectroscopy journal October 2013
Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy journal January 2015
Investigation of solid/vapor interfaces using ambient pressure X-ray photoelectron spectroscopy journal January 2013
Photoelectron spectroscopy of wet and gaseous samples through graphene membranes journal January 2014
Ion spatial distributions at the liquid–vapor interface of aqueous potassium fluoride solutions journal January 2008
Unravelling the electrochemical double layer by direct probing of the solid/liquid interface journal August 2016
Graphene oxide windows for in situ environmental cell photoelectron spectroscopy journal August 2011
Photoelectron spectroscopy of surfaces under humid conditions journal March 2010

Cited By (1)

Ambient Pressure Photoelectron Spectroscopy: Opportunities in Catalysis from Solids to Liquids and Introducing Time Resolution journal January 2018

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY