Resonant soft X-ray scattering for polymer materials

Liu, Feng; Brady, Michael A.; Wang, Cheng

doi:10.1016/j.eurpolymj.2016.04.014

Title: Resonant soft X-ray scattering for polymer materials

Journal Article · Sat Apr 16 00:00:00 EDT 2016 · European Polymer Journal

DOI:https://doi.org/10.1016/j.eurpolymj.2016.04.014· OSTI ID:1379534

Liu, Feng ^[1]; Brady, Michael A. ^[1];

^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Resonant Soft X-ray Scattering (RSoXS) was developed within the last few years, and the first dedicated resonant soft X-ray scattering beamline for soft materials was constructed at the Advanced Light Source, LBNL. RSoXS combines soft X-ray spectroscopy with X-ray scattering and thus offers statistical information for 3D chemical morphology over a large length scale range from nanometers to micrometers. Using RSoXS to characterize multi-length scale soft materials with heterogeneous chemical structures, we have demonstrated that soft X-ray scattering is a unique complementary technique to conventional hard X-ray and neutron scattering. Its unique chemical sensitivity, large accessible size scale, molecular bond orientation sensitivity with polarized X-rays, and high coherence have shown great potential for chemically specific structural characterization for many classes of materials.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1379534

Alternate ID(s):: OSTI ID: 1359101

Journal Information:: European Polymer Journal, Vol. 81, Issue C; ISSN 0014-3057

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 76 works

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