Decoupling Complex Multi–Length–Scale Morphology in Non–Fullerene Photovoltaics with Nitrogen K–Edge Resonant Soft X–ray Scattering

Zhong, Wenkai; Zhang, Ming; Freychet, Guillaume; Su, Gregory M.; Ying, Lei; Huang, Fei; Cao, Yong; Zhang, Yongming; Wang, Cheng; Liu, Feng

doi:10.1002/adma.202107316

Title: Decoupling Complex Multi–Length–Scale Morphology in Non–Fullerene Photovoltaics with Nitrogen K–Edge Resonant Soft X–ray Scattering

Journal Article · Sat Dec 18 00:00:00 EST 2021 · Advanced Materials

DOI:https://doi.org/10.1002/adma.202107316· OSTI ID:1894068

^[1]; Zhang, Ming ^[2]; Freychet, Guillaume ^[3];

^[4]; Ying, Lei ^[5]; Huang, Fei ^[5]; Cao, Yong ^[5]; Zhang, Yongming ^[2];

^[4];

^[2]

Shanghai Jiao Tong Univ. (China); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Shanghai Jiao Tong Univ. (China)
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
South China Univ. of Technology (SCUT), Guangzhou (China)

Abstract Complex morphology in organic photovoltaics (OPVs) and other functional soft materials commonly dictates performance. Such complexity in OPVs originates from the mesoscale kinetically trapped non‐equilibrium state, which governs device charge generation and transport. Resonant soft X‐ray scattering (RSoXS) has been revolutionary in the exploration of OPV morphology in the past decade due to its chemical and orientation sensitivity. However, for non‐fullerene OPVs, RSoXS analysis near the carbon K‐edge is challenging, due to the chemical similarity of the materials used in active layers. An innovative approach is provided by nitrogen K‐edge RSoXS (NK‐RSoXS), utilizing the spatial and orientational contrasts from the cyano groups in the acceptor materials, which allows for determination of phase separation. NK‐RSoXS clearly visualizes the combined feature sizes in PM6:Y6 blends from crystallization and liquid–liquid demixing, while PM6:Y6:Y6‐BO ternary blends with reduced phase‐separation size and enhanced material crystallization can lead to current amplification in devices. Nitrogen is common in organic semiconductors and other soft materials, and the strong and directional N 1s → π* resonances make NK‐RSoXS a powerful tool to uncover the mesoscale complexity and open opportunities to understand heterogeneous systems.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Natural Science Foundation of China (NSFC); Shanghai Jiao Tong University; Shanghai Science and Technology Commission

Grant/Contract Number:: AC02-05CH11231; 51973110; 21734009; 21905102; 20ZR1426200; DE‐AC02‐05CH11231

OSTI ID:: 1894068

Alternate ID(s):: OSTI ID: 1836598

Journal Information:: Advanced Materials, Vol. 34, Issue 6; ISSN 0935-9648

Publisher:: WileyCopyright Statement

Country of Publication:: United States

Language:: English

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Title: Decoupling Complex Multi–Length–Scale Morphology in Non–Fullerene Photovoltaics with Nitrogen K–Edge Resonant Soft X–ray Scattering

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