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Compressional residual stress in Bastogne boudins revealed by synchrotron X-ray microdiffraction

Journal Article · · Geophysical Research Letters
DOI:https://doi.org/10.1002/2016GL069236· OSTI ID:1378751
 [1];  [2];  [1];  [3];  [4];  [3]
  1. Xi'an Jiaotong Univ. (China). Center for Advancing Materials Performance from the Nanoscale
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source
  3. Univ. of California, Berkeley, CA (United States). Dept. of Earth and Planetary Science
  4. Department of Earth and Environmental Sciences, KU Leuven, Leuven Belgium; Katholieke Univ. Leuven, Heverlee (Belgium). Dept. of Earth and Environmental Sciences
+ Show Author Affiliations
Lattice distortions in crystals can be mapped at the micron scale using synchrotron X-ray Laue microdiffraction (μXRD). From lattice distortions the shape and orientation of the elastic strain tensor can be derived and interpreted in terms of residual stress. We apply the new method to vein quartz from the original boudinage locality at Bastogne, Belgium. Furthermore, a long-standing debate surrounds the kinematics of the Bastogne boudins. The μXRD measurements reveal a shortening residual elastic strain, perpendicular to the vein wall, corroborating the model that the Bastogne boudins formed by layer-parallel shortening and not by layer-parallel extension, as is in the geological community generally inferred by the process of boudinage.
Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
Grant/Contract Number:
AC02-05CH11231; FG02-05ER15637
OSTI ID:
1378751
Alternate ID(s):
OSTI ID: 1376757
Journal Information:
Geophysical Research Letters, Journal Name: Geophysical Research Letters Journal Issue: 12 Vol. 43; ISSN 0094-8276
Publisher:
American Geophysical UnionCopyright Statement
Country of Publication:
United States
Language:
English

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Cited By (3)

High‐Angular Resolution Electron Backscatter Diffraction as a New Tool for Mapping Lattice Distortion in Geological Minerals journal July 2019
High-Angular Resolution Electron Backscatter Diffraction as a New Tool for Mapping Lattice Distortion in Geological Minerals text January 2019
High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals preprint January 2019

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