Anomalous vibrational modes in few layer WTe2 revealed by polarized Raman scattering and first-principles calculations

Cao, Yan; Sheremetyeva, Natalya; Liang, Liangbo; Yuan, Hui; Zhong, Tingting; Meunier, Vincent; Pan, Minghu

doi:10.1088/2053-1583/aa7f5a

Title: Anomalous vibrational modes in few layer WTe₂ revealed by polarized Raman scattering and first-principles calculations

Journal Article · Wed Aug 02 00:00:00 EDT 2017 · 2D Materials

DOI:https://doi.org/10.1088/2053-1583/aa7f5a· OSTI ID:1376514

Cao, Yan ^[1]; Sheremetyeva, Natalya ^[2];

^[3]; Yuan, Hui ^[1]; Zhong, Tingting ^[1];

^[2]; Pan, Minghu ^[1]

Huazhong Univ. of Science and Technology, Wuhan (China)
Rensselaer Polytechnic Inst., Troy, NY (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

When layered transition-metal dichalcogenides (TMDs) are scaled down from a three- to a two-dimensional geometry, electronic and structural transitions occur, leading to the emergence of properties not usually found in the bulk. Here, we report a systematic Raman study of exfoliated semi-metallic WTe₂ flakes with thickness ranging from few layers down to a single layer. A dramatic change in the Raman spectra occurs between the monolayer and few-layer WTe₂ as a vibrational mode centered at ~86.9 cm^-1 in the monolayer splits into two active modes at 82.9 and 89.6 cm^-1 in the bilayer. Davydov splitting of these two modes is found in the bilayer, as further evidenced by polarized Raman measurements. Strong angular dependence of Raman modes on the WTe₂ film thickness reflects that the existence of directional interlayer interaction, rather than isotropic van der Waals (vdw) coupling, is playing an essential role affecting the phonon modes, especially in anisotropic 2D WTe₂ material. Therefore, the strong evolution of Raman modes with thickness and polarization direction, can not only be a reliable fingerprint for the determination of the thickness and the crystallographic orientation, but can also be an ideal probe for such strong and directional interlayer interaction.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1376514

Journal Information:: 2D Materials, Vol. 4, Issue 3; ISSN 2053-1583

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 24 works

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