Determination of the resistivity anisotropy of orthorhombic materials via transverse resistivity measurements

Walmsley, P.; Fisher, I. R.

doi:10.1063/1.4978908

Determination of the resistivity anisotropy of orthorhombic materials via transverse resistivity measurements

Journal Article · Wed Apr 05 00:00:00 EDT 2017 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4978908· OSTI ID:1368579

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Stanford Univ., Stanford, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)

Measurements of the resistivity anisotropy can provide crucial information about the electronic structure and scattering processes in anisotropic and low-dimensional materials, but quantitative measurements by conventional means often suffer very significant systematic errors. Here we describe a novel approach to measuring the resistivity anisotropy of orthorhombic materials, using a single crystal and a single measurement that is derived from a π/4 rotation of the measurement frame relative to the crystallographic axes. In this new basis, the transverse resistivity gives a direct measurement of the resistivity anisotropy, which combined with the longitudinal resistivity also gives the in-plane elements of the conventional resistivity tensor via a 5-point contact geometry. In conclusion, this is demonstrated through application to the charge-density wave compound ErTe₃, and it is concluded that this method presents a significant improvement on existing techniques, particularly when measuring small anisotropies.

View Accepted Manuscript (DOE)

Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1368579

Alternate ID(s):: OSTI ID: 1361792

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 4 Vol. 88; ISSN 0034-6748; ISSN RSINAK

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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