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Title: Development and characterization of monolithic multilayer Laue lens nanofocusing optics

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4955022· OSTI ID:1354326

We have developed an experimental approach to bond two independent linear Multilayer Laue Lenses (MLLs) together. A monolithic MLL structure was characterized using ptychography at 12 keV photon energy, and we demonstrated 12 nm and 24 nm focusing in horizontal and vertical directions, respectively. Fabrication of 2D MLL optics allows installation of these focusing elements in more conventional microscopes suitable for x-ray imaging using zone plates, and opens easier access to 2D imaging with high spatial resolution in the hard x-ray regime.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
SC00112704
OSTI ID:
1354326
Report Number(s):
BNL-112842-2016-JA
Journal Information:
Applied Physics Letters, Vol. 108, Issue 26; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English

References (25)

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Cited By (6)

X-ray Microscopy book January 2019
Unsupervised Data Mining in nanoscale X-ray Spectro-Microscopic Study of NdFeB Magnet journal September 2016
Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions journal September 2018
High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope journal November 2017
X-ray microscopy journal July 1965
Q&A: Why use synchrotron x-ray tomography for multi-scale connectome mapping? journal December 2017

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