Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Time-resolved correlative optical microscopy of charge-carrier transport, recombination, and space-charge fields in CdTe heterostructures

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4976696· OSTI ID:1349803
From time- and spatially resolved optical measurements, we show that extended defects can have a large effect on the charge-carrier recombination in II-VI semiconductors. In CdTe double heterostructures grown by molecular beam epitaxy on the InSb (100)-orientation substrates, we characterized the extended defects and found that near stacking faults the space-charge field extends by 2-5 μm. Charge carriers drift (with the space-charge field strength of 730-1,360 V cm-1) and diffuse (with the mobility of 260 ± 30 cm2 V-1 s-1) toward the extended defects, where the minority-carrier lifetime is reduced from 560 ns to 0.25 ns. Furthermore, the extended defects are nonradiative recombination sinks that affect areas significantly larger than the typical crystalline grains in II-VI solar cells. From the correlative time-resolved photoluminescence and second-harmonic generation microscopy data, we developed a band-diagram model that can be used to analyze the impact of extended defects on solar cells and other electronic devices.
Research Organization:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Organization:
USDOE; USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1349803
Alternate ID(s):
OSTI ID: 1348947
Report Number(s):
NREL/JA--5900-67479
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 8 Vol. 110; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (30)

Electric-field-induced second-harmonic microscopy journal December 2003
Dislocation-limited performance of advanced solar cells determined by TCAD modeling journal December 2016
Measuring long-range carrier diffusion across multiple grains in polycrystalline semiconductors by photoluminescence imaging journal October 2013
CdTe solar cells with open-circuit voltage breaking the 1 V barrier journal February 2016
Monocrystalline CdTe solar cells with open-circuit voltage over 1 V and efficiency of 17% journal May 2016
Direct imaging of carrier motion in organic transistors by optical second-harmonic generation journal October 2007
Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy journal June 2013
Spatial resolution versus data acquisition efficiency in mapping an inhomogeneous system with species diffusion journal June 2015
Observation and first-principles calculation of buried wurtzite phases in zinc-blende CdTe thin films journal September 2000
Excitation-dependent recombination and diffusion near an isolated dislocation in GaAs journal May 2012
An extended defect as a sensor for free carrier diffusion in a semiconductor journal January 2013
Mapping electric field distributions in biased organic bulk heterojunctions under illumination by nonlinear optical microscopy journal January 2013
Charge-carrier transport and recombination in heteroepitaxial CdTe journal September 2014
Recombination by grain-boundary type in CdTe journal July 2015
Two dimensional numerical simulations of carrier dynamics during time-resolved photoluminescence decays in two-photon microscopy measurements in semiconductors journal July 2015
Surface stability and the selection rules of substrate orientation for optimal growth of epitaxial II-VI semiconductors journal October 2015
Probing surface recombination velocities in semiconductors using two-photon microscopy journal March 2016
Second-harmonic microscopy of strain fields around through-silicon-vias journal April 2016
Long carrier lifetimes in large-grain polycrystalline CdTe without CdCl2 journal June 2016
Beneficial effect of post-deposition treatment in high-efficiency Cu(In,Ga)Se2 solar cells through reduced potential fluctuations journal August 2016
Impact of extended defects on recombination in CdTe heterostructures grown by molecular beam epitaxy journal August 2016
Cathodoluminescence spectrum imaging analysis of CdTe thin-film bevels journal September 2016
Carrier Decay and Diffusion Dynamics in Single-Crystalline CdTe as Seen via Microphotoluminescence journal September 2014
Optically determined minority-carrier transport in GaAs/ Al x Ga 1 − x As heterostructures journal June 1993
Carrier Separation at Dislocation Pairs in CdTe journal August 2013
Grain-Boundary-Enhanced Carrier Collection in CdTe Solar Cells journal April 2014
Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation journal October 2013
Analysis of Recombination in CdTe Heterostructures With Time-Resolved Two-Photon Excitation Microscopy journal November 2016
Impact of two-photon absorption on second-harmonic generation in CdTe as probed by wavelength-dependent Z-scan nonlinear spectroscopy journal January 2013
Probing carrier lifetimes at dislocations in epitaxial CdTe journal May 2014

Cited By (2)

Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering journal June 2018
Recombination and bandgap engineering in CdSeTe/CdTe solar cells journal July 2019

Similar Records

Comprehensive Study of Carrier Recombination in High‐Efficiency CdTe Solar Cells Using Transient Photovoltage
Journal Article · Sun Apr 14 20:00:00 EDT 2024 · Solar RRL · OSTI ID:2575950

Analysis of Recombination in CdTe Heterostructures With Time-Resolved Two-Photon Excitation Microscopy
Journal Article · Mon Oct 31 20:00:00 EDT 2016 · IEEE Journal of Photovoltaics · OSTI ID:1330947

Impact of extended defects on recombination in CdTe heterostructures grown by molecular beam epitaxy
Journal Article · Mon Aug 29 00:00:00 EDT 2016 · Applied Physics Letters · OSTI ID:22590495