neutron-Induced Failures in semiconductor Devices
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Single Event Effects are a very significant failure mode in modern semiconductor devices that may limit their reliability. Accelerated testing is important for semiconductor industry. Considerable more work is needed in this field to mitigate the problem. Mitigation of this problem will probably come from Physicists and Electrical Engineers working together
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC52-06NA25396
- OSTI ID:
- 1346851
- Report Number(s):
- LA-UR-17-22103
- Country of Publication:
- United States
- Language:
- English
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