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Statistical Framework for Planning a Component Shelf Life Program.

Technical Report ·
DOI:https://doi.org/10.2172/1346330· OSTI ID:1346330
 [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
This document outlines a statistical framework for establishing a shelf-life program for components whose performance is measured by the value of a continuous variable such as voltage or function time. The approach applies to both single measurement devices and repeated measurement devices, although additional process control charts may be useful in the case of repeated measurements. The approach is to choose a sample size that protects the margin associated with a particular variable over the life of the component. Deviations from expected performance of the measured variable are detected prior to the complete loss of margin. This ensures the reliability of the component over its lifetime.
Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1346330
Report Number(s):
SAND--2017-2027; 651300
Country of Publication:
United States
Language:
English

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