Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]

Yoo, Jae -Hyuck; Lange, Andrew; Bude, Jeff; Elhadj, Selim

doi:10.1364/OME.7.000817

Title: Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]

Journal Article · Fri Feb 10 00:00:00 EST 2017 · Optical Materials Express

DOI:https://doi.org/10.1364/OME.7.000817· OSTI ID:1345329

Yoo, Jae -Hyuck ^[1]; Lange, Andrew ^[1]; Bude, Jeff ^[1]; Elhadj, Selim ^[1]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

In this paper, we investigated whether the optical and electrical properties of indium tin oxide (ITO) films are degraded under laser irradiation below their laser ablation threshold. While performing multi-pulse laser damage experiments on a single ITO film (4.7 ns, 1064 nm, 10 Hz), we examined the optical and electrical properties in situ. A decrease in reflectance was observed prior to laser damage initiation. However, under sub-damage threshold irradiation, conductivity and reflectance of the film were maintained without measurable degradation. This indicates that ITO films in optoelectronic devices may be operated below their lifetime laser damage threshold without noticeable performance degradation.

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Research Organization:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1345329

Report Number(s):: LLNL-JRNL-712977

Journal Information:: Optical Materials Express, Vol. 7, Issue 3; ISSN 2159-3930

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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