A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process

Conference · Mon Nov 21 00:00:00 EST 2016

DOI:https://doi.org/10.1109/PVSC.2016.7749741· OSTI ID:1343876

Oh, Jaewon; Dahal, Som; Dauksher, Bill; Bowden, Stuart; Tamizhmani, Govindasamy; Hacke, Peter

Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1343876
• Report Number(s): NREL/CP-5J00-65813
• Resource Relation: Conference: Presented at the 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 5-10 June 2016, Portland, Oregon
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
Illuminated Lock-In Thermography
ILIT
PID
potential induced degradation
silicon nitride antireflection coating