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Title: Quantum Efficiency Loss after PID Stress: Wavelength Dependence on Cell Surface and Cell Edge

Abstract

It is known that the potential induced degradation (PID) stress of conventional p-base solar cells affects power, shunt resistance, junction recombination, and quantum efficiency (QE). One of the primary solutions to address the PID issue is a modification of chemical and physical properties of antireflection coating (ARC) on the cell surface. Depending on the edge isolation method used during cell processing, the ARC layer near the edges may be uniformly or non-uniformly damaged. Therefore, the pathway for sodium migration from glass to the cell junction could be either through all of the ARC surface if surface and edge ARC have low quality or through the cell edge if surface ARC has high quality but edge ARC is defective due to certain edge isolation process. In this study, two PID susceptible cells from two different manufacturers have been investigated. The QE measurements of these cells before and after PID stress were performed at both surface and edge. We observed the wavelength dependent QE loss only in the first manufacturer's cell but not in the second manufacturer's cell. The first manufacturer's cell appeared to have low quality ARC whereas the second manufacturer's cell appeared to have high quality ARC with defective edge.more » To rapidly screen a large number of cells for PID stress testing, a new but simple test setup that does not require laminated cell coupon has been developed and is used in this investigation.« less

Authors:
; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1311348
Report Number(s):
NREL/CP-5J00-63705
DOE Contract Number:
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 14-19 June 2015, New Orleans, Louisiana
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; PID; quantum efficiency; durability; shunting; edge isolation; photovoltaic cells

Citation Formats

Oh, Jaewon, Bowden, Stuart, TamizhMani, GovindaSamy, and Hacke, Peter. Quantum Efficiency Loss after PID Stress: Wavelength Dependence on Cell Surface and Cell Edge. United States: N. p., 2015. Web. doi:10.1109/PVSC.2015.7355629.
Oh, Jaewon, Bowden, Stuart, TamizhMani, GovindaSamy, & Hacke, Peter. Quantum Efficiency Loss after PID Stress: Wavelength Dependence on Cell Surface and Cell Edge. United States. doi:10.1109/PVSC.2015.7355629.
Oh, Jaewon, Bowden, Stuart, TamizhMani, GovindaSamy, and Hacke, Peter. 2015. "Quantum Efficiency Loss after PID Stress: Wavelength Dependence on Cell Surface and Cell Edge". United States. doi:10.1109/PVSC.2015.7355629.
@article{osti_1311348,
title = {Quantum Efficiency Loss after PID Stress: Wavelength Dependence on Cell Surface and Cell Edge},
author = {Oh, Jaewon and Bowden, Stuart and TamizhMani, GovindaSamy and Hacke, Peter},
abstractNote = {It is known that the potential induced degradation (PID) stress of conventional p-base solar cells affects power, shunt resistance, junction recombination, and quantum efficiency (QE). One of the primary solutions to address the PID issue is a modification of chemical and physical properties of antireflection coating (ARC) on the cell surface. Depending on the edge isolation method used during cell processing, the ARC layer near the edges may be uniformly or non-uniformly damaged. Therefore, the pathway for sodium migration from glass to the cell junction could be either through all of the ARC surface if surface and edge ARC have low quality or through the cell edge if surface ARC has high quality but edge ARC is defective due to certain edge isolation process. In this study, two PID susceptible cells from two different manufacturers have been investigated. The QE measurements of these cells before and after PID stress were performed at both surface and edge. We observed the wavelength dependent QE loss only in the first manufacturer's cell but not in the second manufacturer's cell. The first manufacturer's cell appeared to have low quality ARC whereas the second manufacturer's cell appeared to have high quality ARC with defective edge. To rapidly screen a large number of cells for PID stress testing, a new but simple test setup that does not require laminated cell coupon has been developed and is used in this investigation.},
doi = {10.1109/PVSC.2015.7355629},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2015,
month = 6
}

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